XIVA™ LSIM ( Laser Signal Injection Microscopy)

XIVATM LSIM (Laser Signal Injection Microscopy) is used to locate shorts, junction defects, problem VIAs and other integrated circuit defects. XIVATM  works by scanning a laser beam through a microscope lens, over an integrated circuit while monitoring the device I/V response for laser induced changes. By choosing the laser wavelength, different effects can be produced. Short wavelength lasers produce electron/hole pairs, (photo-carriers) in the semiconductor. These photon-generated carriers reveal failure sites in transistors and PN junctions.