The P series offers the flexibility of measuring a wide variety of sample sizes, shapes, and quantities. It is equipped with a high precision programmable X-Y stage that offers several convenience factors over a fixed stage. Operators can use the mouse and software interface to move to desired measurement locations easily. Multi-point programs can be created to automatically measure multiple sample locations with the click of a button. Pinpoint control is achievable for testing critical areas. Larger sampling volumes are possible through multi-point programming.

The standard configuration includes a 4-position multiple collimator assembly, and a variable focus camera for measurement in recessed areas. Collimators and focal distances can be customized to the application. The solid-state PIN detector is included along with our long-life micro-focus x-ray tube. An SDD detector is optional.

Now available with extended stage option

The P Series XRF is best suited to customers with these requirements:

• Small parts/features such as fasteners, connectors, or PCBs
• Requirements to test multiple samples or locations per new lot of material
• Desire to automate measurement on multiple samples
• Variety of sample sizes and applications
• Guaranteed to meet IPC-4552A, 4553A, 4554 and 4556
• ASTM B568, DIN 50987 and ISO 3497