MK.1TE ESD and Static Latch-up Test System

The Thermo Scientific™ MK.1TE ESD and Static Latch-up Test System provides users with advanced capabilities to test midrange pin count devices to today’s Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design ensures recently identified waveform hazards in the standards, such as the trailing pulse and the pre-discharge voltage rise are addressed. Trailing pulses were shown to cause non-ESD related failures by exposing the DUT to an electrical overstress after the main HBM event. Pre-discharge voltage can cause voltage-triggered protection structures to fail, as the pin under test may not be at zero volts when the HBM event occurs. A user-selectable 10K Shunt can be connected during the pulse to eliminate any voltage prior to the actual HBM event. A combination test system, today’s MK.1 test system also performs Static Latch-Up testing per JEDEC’s EIA/JESD 78 method.