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26 Aug 2015
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CONTACT INFO

Fintexs Technologies Sdn Bhd
 
Contact
 
:
 
Mr. Ricky Lim
ricky@fintexs.com.my
 
Ms. Chew
wanchiun@fintexs.com.my
 
Tel : 04 - 656 6648
 

PRODUCTS

Analytical Probing Solutions

 
Everbeing BD8 Probe Station Everbeing EB8 Probe Station Everbeing PE4 Probe Station Cryogenics Probe Station LCD Probe Station Hall effect Probe Station General Product Introduction

 
Everbeing BD8 Probe Station Back To Top
 

Everbeing BD8 Probe StationFeatures:-

  • Coaxial-Driven Chuck Stage
  • RF Probing Field Upgradable
  • 20X~4000X Magnification
  • Backlash-Free Movement
  • Platen Linear Quick Up/Down
  • Easy Load/Unload wafer
  • Platen Linear Fine Up/Down
  • Probe Card Tip Overdrive Adjustment

Specifications:-

  • Vacuum Chuck : 8" Stainless Steel
  • Chuck Stage: 8" x8" Travel
  • Chuck Theta : 0~30 degree
  • Platen Up/: 6mm Adjustable
  • Down Coarse Adjustment : Lever-Driven
  • Platen Up/Down: 25 mm Adjustable
  • Fine Adjustment: Hand Wheel-Driven
  • Platen: 12 Micropositioner
  • Microscope Stage: 1" x1" Travel

 
Everbeing EB8 Probe Station Back To Top
 

Everbeing EB8 Probe StationFeatures:-

  • Coaxial-Driven Chuck Stage
  • RF Probing Field Upgradable
  • 20X~4000X Magnification
  • Backlash-Free Movement
  • Choice of microscope (tilt) Up/Down For E-Z revolving Objectives

Specifications:-

  • Vacuum Chuck : 8" Stainless Steel
  • Chuck Stage: 8" x8" Travel
  • Chuck Theta : 0~30 degree
  • Platen Up/: 4mm Adjustable
  • Platen: 12 Micropositioner
  • Microscope Stage: 1" x1" Travel

 
Everbeing PE4 Probe Station Back To Top
 

Everbeing PE4 Probe StationFeatures:-

  • Compact Size
  • Light Weight
  • Price Affordable
  • Electro- Optics Application
  • Light Intensity/ Wave length measurement for LED/LD/PD
  • RF probing East/West
  • University Lab suitable
  • Ideal for small wafer less than 4"
  • Side Driven Chuck Stage
  • Backlash Free Movement

Specifications:-

  • Vacuum Chuck : 4" Stainless Steel
  • Chuck Stage: 3" x 3” Travel
  • Chuck Theta : 0~30 degree
  • Platen: 6 Micropositioner

 
Cryogenics Probe Station Back To Top
 

Cryogenics Probe StationProber at cryogenics temperature in the vacuum chamber
Prober at high temp. like 400,500,600&700degree C in the vacuum chamber

Cryogenics :

Because the wafer is probed at the cryogenics temperature,the moisture will appear and freeze on the wafer.This moisture will result in the leakage as high as to make the measurement failure.The moisture in the chamber is removed by the vacuum pump.The pump has to be kept running all the measurement long.

High Temp. Oxygen-Free :

When the wafer is heated up more than 300 degree C ,400 degree C,500 degree C and higher,oxidation will occur greatly.The higher the temperature,the more greatly it oxidize on the wafer surface.The oxidation will make the wafer degrade electrically,physically & mechanically.The oxygen in the chamber is removed by the vacuum pump.The pump has to be kept running all the measurement long.Because the chuck will be controlled thermally for the application both for cryogenics and high temperature,the probed tip on the wafer will shift somewhat by the wafer shrinkage and expansion.As a result,some of the tips have to be re-positioned by the micropositioner with the control knobs X-Y-Z put ouside the vacuum chamber.

Alternatively,the motorized micropositioner with the joystick control panel outside can re-positioned the tip in the chamber easily.


 
LCD Probe Station Back To Top
 

LCD Probe StationPCB Inspection Laser Repair

This one is custom-made inspection station for large size substrate like LCD,OLED & PCB for the max.size 1200mmx800mm.There are two kinds of mechanism design. Firstly, the chuck can be moved around with the travel covering the substrate size width & depth underneath the fixed microscope.The fine stage of microscope can be positioned with travel 1"x1". Secondly,the microscope can be moved around with the travel covering the substrate size width & depth over the fixed chuck. No matter whichever kinds the microscope comes with pneumatic quick up for easy loading and unloading the large size substrate.


 
Hall Effect Probe Station Back To Top
 

Hall Effect Probe Station This hall effect prober can be equipped with hot chuck to probe at temperature and shielding box for low current measurement.in addition, customer could specify the magnetic gauss rate to fully meet customer’s requirement at the very affordable price.

There are two magnetic cores each with linear slide underneath moving to the chuck from each side to the probing position with locking mechanism.The chuck X-Y could be moved with 1”-1” travel to locate the measurement target.The chuck could be raised up to the probing position with probing height adjustable if needed.The tip on the micropositioner is precisely positioned X-Y then landed by the knob Z.Other tips could be positioned and landed by the same way.Once the measurement over,you just need to lower the chuck with all the tips held at the same height and spacing one another.

The prober comes with the hot chuck.If you want to measure at certain temperature,all you need to do is to set the temperature on PID controller. Once the measurement over, you could cool down the chuck by the closed- loop cooling system quickly.For the low signal measurement,we provide the total solution for different level requirement like coaxial and triaxial tip holder for customer’s choice with the shelding box as standard


 
General Product Introduction Back To Top
 
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